Shin, D. orcid.org/0000-0002-0840-6449, Yoo, S. and Bae, D.-H. (2016) Diversity-aware mutation adequacy criterion for improving fault detection capability. In: 2016 IEEE Ninth International Conference on Software Testing, Verification and Validation Workshops (ICSTW). 2016 IEEE Ninth International Conference on Software Testing, Verification and Validation Workshops (ICSTW), 11-15 Apr 2016, Chicago, IL, USA. Institute of Electrical and Electronics Engineers (IEEE) , pp. 122-131. ISBN 9781509036752
Abstract
Many existing testing techniques adopt diversity as an important criterion for the selection and prioritization of tests. However, mutation adequacy has been content with simply maximizing the number of mutants that have been killed. We propose a novel mutation adequacy criterion that considers the diversity in the relationship between tests and mutants, as well as whether mutants are killed. Intuitively, the proposed criterion is based on the notion that mutants can be distinguished by the sets of tests that kill them. A test suite is deemed adequate by our criterion if the test suite distinguishes all mutants in terms of their kill patterns. Our hypothesis is that, simply by using a stronger adequacy criterion, it is possible to improve fault detection capabilities of mutation-adequate test suites. The empirical evaluation selects tests for real world applications using the proposed mutation adequacy criterion to test our hypothesis. The results show that, for real world faults, test suites adequate to our criterion can increase the fault detection success rate by up to 76.8 percentage points compared to test suites adequate to the traditional criterion.
Metadata
Item Type: | Proceedings Paper |
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Authors/Creators: |
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Copyright, Publisher and Additional Information: | © 2016 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other users, including reprinting/ republishing this material for advertising or promotional purposes, creating new collective works for resale or redistribution to servers or lists, or reuse of any copyrighted components of this work in other works. Reproduced in accordance with the publisher's self-archiving policy. |
Keywords: | Mutation testing; adequacy criteria; diversity |
Dates: |
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Institution: | The University of Sheffield |
Academic Units: | The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Computer Science (Sheffield) |
Depositing User: | Symplectic Sheffield |
Date Deposited: | 22 Sep 2023 09:57 |
Last Modified: | 22 Sep 2023 10:01 |
Status: | Published |
Publisher: | Institute of Electrical and Electronics Engineers (IEEE) |
Refereed: | Yes |
Identification Number: | 10.1109/icstw.2016.37 |
Related URLs: | |
Open Archives Initiative ID (OAI ID): | oai:eprints.whiterose.ac.uk:203531 |