Diversity-aware mutation adequacy criterion for improving fault detection capability

Shin, D. orcid.org/0000-0002-0840-6449, Yoo, S. and Bae, D.-H. (2016) Diversity-aware mutation adequacy criterion for improving fault detection capability. In: 2016 IEEE Ninth International Conference on Software Testing, Verification and Validation Workshops (ICSTW). 2016 IEEE Ninth International Conference on Software Testing, Verification and Validation Workshops (ICSTW), 11-15 Apr 2016, Chicago, IL, USA. Institute of Electrical and Electronics Engineers (IEEE) , pp. 122-131. ISBN 9781509036752

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Item Type: Proceedings Paper
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Keywords: Mutation testing; adequacy criteria; diversity
Dates:
  • Published: 4 August 2016
  • Published (online): 4 August 2016
Institution: The University of Sheffield
Academic Units: The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Computer Science (Sheffield)
Depositing User: Symplectic Sheffield
Date Deposited: 22 Sep 2023 09:57
Last Modified: 22 Sep 2023 10:01
Status: Published
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Refereed: Yes
Identification Number: 10.1109/icstw.2016.37
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