Hewitt, D. orcid.org/0000-0002-4585-2915 and Wang, J. orcid.org/0000-0003-4870-3744 (2021) Prediction of the impact of thermal cycling on machine lifetime based on accelerated life testing and finite element analysis. In: IECON 2021 – 47th Annual Conference of the IEEE Industrial Electronics Society. IECON 2021 - 47th Annual Conference of the IEEE Industrial Electronics Society, 13-16 Oct 2021, Toronto, ON, Canada. IEEE , pp. 1-6. ISBN 9781665435543
Abstract
Electric machines are constructed from a variety of different materials which exhibit different mechanical and thermal expansion properties. Losses within the machine cause an increase in temperature, resulting in thermally induced internal stresses in insulation materials. Changes to the operating condition will result in different levels of loss being produced, and give rise to a thermal cycling profile to the machine and cyclic stress in the insulation. This paper studies the impact of these thermal cycles and resultant cyclic stress in the insulation on the lifetime of machines. Through the use of finite element analysis the internal stress levels, and corresponding stress cycle profiles are determined within the machine insulation layer, this data is then combined with experimental data, allowing stress-life (number of cycles) (SN)-curves to be generated for the machine type under test. The correlation between predicted insulation fatigue life with the measurements provides a physical insight of lifetime reduction due to thermal cycling.
Metadata
Item Type: | Proceedings Paper |
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Authors/Creators: |
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Copyright, Publisher and Additional Information: | © 2021 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other users, including reprinting/ republishing this material for advertising or promotional purposes, creating new collective works for resale or redistribution to servers or lists, or reuse of any copyrighted components of this work in other works. Reproduced in accordance with the publisher's self-archiving policy. |
Keywords: | Electric Machines; Lifetime Estimation; Accelerated Aging; Finite Element Analysis |
Dates: |
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Institution: | The University of Sheffield |
Academic Units: | The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Electronic and Electrical Engineering (Sheffield) |
Funding Information: | Funder Grant number ENGINEERING AND PHYSICAL SCIENCE RESEARCH COUNCIL EP/S018034/1 ENGINEERING AND PHYSICAL SCIENCE RESEARCH COUNCIL EP/S00081X/1 |
Depositing User: | Symplectic Sheffield |
Date Deposited: | 26 Jul 2023 11:55 |
Last Modified: | 26 Jul 2023 11:55 |
Status: | Published |
Publisher: | IEEE |
Refereed: | Yes |
Identification Number: | 10.1109/iecon48115.2021.9589387 |
Related URLs: | |
Open Archives Initiative ID (OAI ID): | oai:eprints.whiterose.ac.uk:201860 |