Prediction of the impact of thermal cycling on machine lifetime based on accelerated life testing and finite element analysis

Hewitt, D. orcid.org/0000-0002-4585-2915 and Wang, J. orcid.org/0000-0003-4870-3744 (2021) Prediction of the impact of thermal cycling on machine lifetime based on accelerated life testing and finite element analysis. In: IECON 2021 – 47th Annual Conference of the IEEE Industrial Electronics Society. IECON 2021 - 47th Annual Conference of the IEEE Industrial Electronics Society, 13-16 Oct 2021, Toronto, ON, Canada. IEEE , pp. 1-6. ISBN 9781665435543

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Item Type: Proceedings Paper
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Keywords: Electric Machines; Lifetime Estimation; Accelerated Aging; Finite Element Analysis
Dates:
  • Published: 10 November 2021
Institution: The University of Sheffield
Academic Units: The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Electronic and Electrical Engineering (Sheffield)
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Grant number
ENGINEERING AND PHYSICAL SCIENCE RESEARCH COUNCIL
EP/S018034/1
ENGINEERING AND PHYSICAL SCIENCE RESEARCH COUNCIL
EP/S00081X/1
Depositing User: Symplectic Sheffield
Date Deposited: 26 Jul 2023 11:55
Last Modified: 26 Jul 2023 11:55
Status: Published
Publisher: IEEE
Refereed: Yes
Identification Number: 10.1109/iecon48115.2021.9589387
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