Hewitt, D. orcid.org/0000-0002-4585-2915, Sundeep, S., Wang, J. orcid.org/0000-0003-4870-3744 et al. (3 more authors) (2022) An experimental assessment of the impact of high dv/dt SiC converters on insulation lifetime of electrical machines. In: 2022 IEEE Energy Conversion Congress and Exposition (ECCE). 2022 IEEE Energy Conversion Congress and Exposition (ECCE), 09-13 Oct 2022, Detroit, MI, USA. IEEE , pp. 1-8. ISBN 9781728193878
Abstract
SiC MOSFETs, capable of operating at higher dc link voltages with faster rise times and higher switching frequency, are becoming more prominent in converter-fed drives. While they offer higher power density and high efficiency with improved performance, they also result in significantly increased voltage stresses to the insulation of machine windings. In this paper, the impact of SiC based converters on the insulation lifetime of a commercially available 2.8kW permanent magnet machine is assessed experimentally at elevated temperatures under a range of dc link voltages, rise times and switching frequencies. The lifetime of these samples and samples fed by a Si based inverter are compared, allowing the impact of SiC inverters to be studied. Specific focus is given to the quantity of partial discharge (PD) activity within the machine windings monitored throughout the experiments. It is shown that presence of PD during tests lead to very significant reduction in insulation lifetime.
Metadata
Item Type: | Proceedings Paper |
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Authors/Creators: |
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Copyright, Publisher and Additional Information: | © 2022 The Authors. Except as otherwise noted, this author-accepted version of a proceedings paper published in 2022 IEEE Energy Conversion Congress and Exposition (ECCE) is made available under the terms of the Creative Commons Attribution 4.0 International License (CC-BY 4.0), which permits unrestricted use, distribution and reproduction in any medium, provided the original work is properly cited. To view a copy of this licence, visit http://creativecommons.org/licenses/by/4.0/ |
Keywords: | Aging; Electric Machines; Materials Reliability; Partial discharges; Wide bandgap semiconductor |
Dates: |
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Institution: | The University of Sheffield |
Academic Units: | The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Electronic and Electrical Engineering (Sheffield) |
Funding Information: | Funder Grant number ENGINEERING AND PHYSICAL SCIENCE RESEARCH COUNCIL EP/S00081X/1 |
Depositing User: | Symplectic Sheffield |
Date Deposited: | 26 Jul 2023 11:43 |
Last Modified: | 26 Jul 2023 11:45 |
Status: | Published |
Publisher: | IEEE |
Refereed: | Yes |
Identification Number: | 10.1109/ecce50734.2022.9948103 |
Open Archives Initiative ID (OAI ID): | oai:eprints.whiterose.ac.uk:201859 |
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Filename: ECCE 2022 paper Experimental assesment of Lifetime Final_resub.pdf
Licence: CC-BY 4.0