Study of avalanche statistics in very low noise AlGaAsSb APDs using a multi-channel analyzer

Pinel, L.L.G. orcid.org/0000-0001-8603-5631, Tan, C.H. orcid.org/0000-0002-8900-9452 and Ng, J.S. orcid.org/0000-0002-1064-0410 (2018) Study of avalanche statistics in very low noise AlGaAsSb APDs using a multi-channel analyzer. In: Mitrofanov, O., Tan, C.H., Pau Vizcaíno, J.L. and Razeghi, M., (eds.) Optical Sensing, Imaging, and Photon Counting: From X-Rays to THz. Optical Sensing, Imaging, and Photon Counting: From X-Rays to THz, 19-23 Aug 2018, San Diego, California, United States. Proceedings of SPIE, 10729 . Society of Photo-optical Instrumentation Engineers (SPIE) , 107290O. ISBN 9781510620292

Abstract

Metadata

Item Type: Proceedings Paper
Authors/Creators:
Editors:
  • Mitrofanov, O.
  • Tan, C.H.
  • Pau Vizcaíno, J.L.
  • Razeghi, M.
Copyright, Publisher and Additional Information:

© 2018 Society of Photo Optical Instrumentation Engineers (SPIE). One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this publication for a fee or for commercial purposes, or modification of the contents of the publication are prohibited.

Keywords: Avalanche Photodiodes; avalanche gain; excess noise; multi-channel analyzer
Dates:
  • Published: 18 September 2018
  • Published (online): 18 September 2018
Institution: The University of Sheffield
Academic Units: The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Electronic and Electrical Engineering (Sheffield)
Funding Information:
Funder
Grant number
ENGINEERING AND PHYSICAL SCIENCE RESEARCH COUNCIL
EP/K001469/1
EUROPEAN COMMISSION - HORIZON 2020
PROMIS 641899
Depositing User: Symplectic Sheffield
Date Deposited: 31 Mar 2023 16:37
Last Modified: 31 Mar 2023 22:13
Status: Published
Publisher: Society of Photo-optical Instrumentation Engineers (SPIE)
Series Name: Proceedings of SPIE
Refereed: Yes
Identification Number: 10.1117/12.2326846
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Open Archives Initiative ID (OAI ID):

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