Pinel, L.L.G. orcid.org/0000-0001-8603-5631, Tan, C.H. orcid.org/0000-0002-8900-9452 and Ng, J.S. orcid.org/0000-0002-1064-0410 (2018) Study of avalanche statistics in very low noise AlGaAsSb APDs using a multi-channel analyzer. In: Mitrofanov, O., Tan, C.H., Pau Vizcaíno, J.L. and Razeghi, M., (eds.) Optical Sensing, Imaging, and Photon Counting: From X-Rays to THz. Optical Sensing, Imaging, and Photon Counting: From X-Rays to THz, 19-23 Aug 2018, San Diego, California, United States. Proceedings of SPIE, 10729 . Society of Photo-optical Instrumentation Engineers (SPIE) , 107290O. ISBN 9781510620292
Abstract
The usefulness of avalanche photodiodes (APDs) resides in their ability to produce internal gain via impact ionization without generating excessive noise. This process is stochastic and the gain values fluctuate around a mean value, giving rise to the so-called excess noise. In this work, we evaluate the gain fluctuations in APDs using a multi-channel analyzer (MCA). Two Al0.85Ga0.15As0.56Sb 0.44APDs, one p-i-n and one n-i-p were used. Illuminated with a pulsed light source, the APDs were connected to a charge-sensitive amplifier, counting the number of charges created by each avalanche event initiated by the light pulse. The signal was subsequently sent to an MCA, recording the gain values and outputting a gain spectrum. Both APDs were investigated for mean gains up to ∼ 9. For a given mean gain, the gain distribution for the n-i-p diode was found to be significantly broader than for the p-i-n diode, as expected from the excess noise values previously measured in those devices. The coefficient of variance (CoV), defined as the ratio of standard deviation to mean value of the gain peaks, was found to be low for the p-i-n APD, consistent with the low excess noise values in this material. For higher mean gain values, the CoV of the n-i-p APD gave higher values than for the p-i-n APD, again corroborating the conventional excess noise measurements.
Metadata
Item Type: | Proceedings Paper |
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Authors/Creators: |
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Editors: |
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Copyright, Publisher and Additional Information: | © 2018 Society of Photo Optical Instrumentation Engineers (SPIE). One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this publication for a fee or for commercial purposes, or modification of the contents of the publication are prohibited. |
Keywords: | Avalanche Photodiodes; avalanche gain; excess noise; multi-channel analyzer |
Dates: |
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Institution: | The University of Sheffield |
Academic Units: | The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Electronic and Electrical Engineering (Sheffield) |
Funding Information: | Funder Grant number ENGINEERING AND PHYSICAL SCIENCE RESEARCH COUNCIL EP/K001469/1 EUROPEAN COMMISSION - HORIZON 2020 PROMIS 641899 |
Depositing User: | Symplectic Sheffield |
Date Deposited: | 31 Mar 2023 16:37 |
Last Modified: | 31 Mar 2023 22:13 |
Status: | Published |
Publisher: | Society of Photo-optical Instrumentation Engineers (SPIE) |
Series Name: | Proceedings of SPIE |
Refereed: | Yes |
Identification Number: | 10.1117/12.2326846 |
Related URLs: | |
Open Archives Initiative ID (OAI ID): | oai:eprints.whiterose.ac.uk:197833 |