Toward a better modulus at shallow indentations—Enhanced tip and sample characterization for quantitative atomic force microscopy

Owen, D.S. (2023) Toward a better modulus at shallow indentations—Enhanced tip and sample characterization for quantitative atomic force microscopy. Microscopy Research and Technique, 86 (1). pp. 84-96. ISSN 1059-910X

Abstract

Metadata

Item Type: Article
Authors/Creators:
  • Owen, D.S.
Copyright, Publisher and Additional Information:

© 2022 The Authors. This is an open access article under the terms of the Creative Commons Attribution License, which permits use, distribution and reproduction in any medium, provided the original work is properly cited. (https://creativecommons.org/licenses/by/4.0/)

Keywords: contact mechanics; polydimethylsiloxane; probe geometry; quantitative atomic force microscopy; scanning electron microscopy
Dates:
  • Published: January 2023
  • Published (online): 18 November 2022
  • Accepted: 5 November 2022
Institution: The University of Sheffield
Academic Units: The University of Sheffield > Faculty of Science (Sheffield) > Department of Physics and Astronomy (Sheffield)
Depositing User: Symplectic Sheffield
Date Deposited: 22 Nov 2022 11:49
Last Modified: 26 Sep 2024 09:43
Status: Published
Publisher: Wiley
Refereed: Yes
Identification Number: 10.1002/jemt.24261
Open Archives Initiative ID (OAI ID):

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