Yin, Y., Pinchbeck, J., O'Regan, C. et al. (3 more authors) (2022) Fabrication of semi-polar (11-22) GaN V-groove MOSFET using wet etching trench opening technique. IEEE Electron Device Letters, 43 (10). pp. 1641-1644. ISSN 0741-3106
Abstract
In this letter, we report the fabrication of an enhancement-mode V-groove metal oxide semiconductor field-effect transistor on semi-polar (11-22) GaN platform. A wet crystallographic hydroxide-based etching approach to achieve a vertical inversion trench sidewall is utilized. This novel fabrication method enables the formation of the vertical trench sidewall channel conduction without the need for a conventional chlorine-based dry etching. The fabricated VMOSFET exhibit a threshold voltage of 9.49 V, a current ON/OFF ratio of >10 7 , an ON-state resistance of 8.0 mΩ.cm 2 , and an output current of 516 A/cm 2 .
Metadata
Item Type: | Article |
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Authors/Creators: |
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Copyright, Publisher and Additional Information: | © 2022 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other users, including reprinting/ republishing this material for advertising or promotional purposes, creating new collective works for resale or redistribution to servers or lists, or reuse of any copyrighted components of this work in other works. Reproduced in accordance with the publisher's self-archiving policy. |
Keywords: | Crystallographic etching; Semi-polar gallium nitride; GaN vertical transistors; V-groove MOSFET |
Dates: |
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Institution: | The University of Sheffield |
Academic Units: | The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Electronic and Electrical Engineering (Sheffield) |
Funding Information: | Funder Grant number ENGINEERING AND PHYSICAL SCIENCE RESEARCH COUNCIL EP/T013001/1 ENGINEERING AND PHYSICAL SCIENCE RESEARCH COUNCIL EP/P006973/1 ENGINEERING AND PHYSICAL SCIENCE RESEARCH COUNCIL EP/P006973/1 |
Depositing User: | Symplectic Sheffield |
Date Deposited: | 05 Sep 2022 16:07 |
Last Modified: | 01 Sep 2023 00:13 |
Status: | Published |
Publisher: | Institute of Electrical and Electronics Engineers (IEEE) |
Refereed: | Yes |
Identification Number: | 10.1109/led.2022.3203633 |
Open Archives Initiative ID (OAI ID): | oai:eprints.whiterose.ac.uk:190726 |