Walther, T. orcid.org/0000-0003-3571-6263, Wolf, F., Recnik, A. et al. (1 more author) (2006) Quantitative microstructural and spectroscopic investigation of inversion domain boundaries in sintered zinc oxide ceramics doped with iron oxide. International Journal of Materials Research, 97 (7). pp. 934-942. ISSN 1862-5282
Abstract
It is known that sintering of powders of zinc oxide (ZnO) with small additions of iron oxide results in a ceramic with grains exhibiting a characteristic inversion domain micro-structure with planar inversion domain boundaries (IDBs) on two different habit planes. This study concentrates on a quantitative analysis, by a combination of different transmission electron microscopy methods, of those IDBs that are parallel to {0001} basal planes of the wurtzite structure of ZnO. Electron diffraction and dark-field imaging prove the nature of the inversion. High-resolution annular dark field scanning transmission electron microscopy allows measurement of the rigid body displacements across these IDBs and of the local lattice contraction related to the octahedral interstices that form the boundaries. Energy-selected imaging, electron energy-loss spectroscopy and energy-dispersive X-ray spectroscopy have been combined to determine the chemical composition of the IDBs quantitatively. It is thus shown unambiguously that every such fault consists of precisely one basal plane of octahedral interstices that are completely occupied by Fe3+ ions and that these FeO6 octahedra are themselves contracted along the <0001> direction. A local charge balance model explains the observations.
Metadata
Item Type: | Article |
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Authors/Creators: |
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Copyright, Publisher and Additional Information: | © 2006 Carl Hanser Verlag, München. |
Keywords: | Energy filtered transmission electron microscopy (EFTEM); Electron energy-loss spectroscopy (EELS); Annular dark-field imaging (Z-contrast); Zinc oxide (ZnO); Inversion domain |
Dates: |
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Institution: | The University of Sheffield |
Academic Units: | The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Electronic and Electrical Engineering (Sheffield) |
Depositing User: | Symplectic Sheffield |
Date Deposited: | 14 Jul 2022 09:24 |
Last Modified: | 14 Jul 2022 09:24 |
Status: | Published |
Publisher: | Walter de Gruyter GmbH (originally published by Carl Hanser Verlag) |
Refereed: | Yes |
Identification Number: | 10.1515/ijmr-2006-0149 |
Open Archives Initiative ID (OAI ID): | oai:eprints.whiterose.ac.uk:189065 |