Increasing the sensitivity of terahertz metamaterials for dielectric sensing by substrate etching

Park, SJ orcid.org/0000-0001-8606-191X, Meng, K, Burnett, AD et al. (12 more authors) (2020) Increasing the sensitivity of terahertz metamaterials for dielectric sensing by substrate etching. In: 2020 45th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz). 2020 45th International Conference on Infrared, Millimeter and Terahertz Waves (IRMMW-THz), 08-13 Nov 2020, Buffalo, NY, USA. IEEE ISBN 978-1-7281-6621-6

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Item Type: Proceedings Paper
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Dates:
  • Published: 8 November 2020
  • Published (online): 11 March 2021
  • Accepted: 20 June 2020
Institution: The University of Leeds
Academic Units: The University of Leeds > Faculty of Engineering & Physical Sciences (Leeds) > School of Electronic & Electrical Engineering (Leeds) > Pollard Institute (Leeds)
Funding Information:
Funder
Grant number
EPSRC (Engineering and Physical Sciences Research Council)
EP/P007449/1
EPSRC (Engineering and Physical Sciences Research Council)
EP/P021859/1
EPSRC (Engineering and Physical Sciences Research Council)
EP/R00501X/1
Depositing User: Symplectic Publications
Date Deposited: 17 Mar 2021 16:12
Last Modified: 30 Mar 2021 13:42
Status: Published
Publisher: IEEE
Identification Number: 10.1109/irmmw-thz46771.2020.9370679
Open Archives Initiative ID (OAI ID):

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