Lim, J, Prestat, E, Carlsson, A et al. (4 more authors) (2020) Application of Modern Scanning/Transmission Electron Microscope with Pixelated STEM Detector for Radiation Damage Study. Microscopy and Microanalysis, 26 (S2). pp. 394-395. ISSN 1431-9276
Metadata
Item Type: | Article |
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Authors/Creators: |
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Copyright, Publisher and Additional Information: | This conference paper has been published in a revised form in Microscopy and Microanalysis [https://doi.org/10.1017/s1431927620014506] This version is free to view and download for private research and study only. Not for re-distribution, re-sale or use in derivative works. © Microscopy Society of America 2020. |
Dates: |
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Institution: | The University of Leeds |
Academic Units: | The University of Leeds > Faculty of Engineering & Physical Sciences (Leeds) > School of Chemical & Process Engineering (Leeds) |
Depositing User: | Symplectic Publications |
Date Deposited: | 11 Dec 2020 11:59 |
Last Modified: | 30 Jan 2021 01:39 |
Status: | Published |
Publisher: | Cambridge University Press (CUP) |
Identification Number: | 10.1017/s1431927620014506 |
Open Archives Initiative ID (OAI ID): | oai:eprints.whiterose.ac.uk:168827 |