Importance-Driven Deep Learning System Testing

Gerasimou, Simos, Eniser, Hasan Ferit and Sen, Alper (2020) Importance-Driven Deep Learning System Testing. In: 42nd International Conference on Software Engineering.

Abstract

Metadata

Item Type: Proceedings Paper
Authors/Creators:
  • Gerasimou, Simos (simos.gerasimou@york.ac.uk)
  • Eniser, Hasan Ferit
  • Sen, Alper
Dates:
  • Published: 2020
  • Accepted: 9 December 2019
Institution: The University of York
Academic Units: The University of York > Faculty of Sciences (York) > Computer Science (York)
Depositing User: Pure (York)
Date Deposited: 10 Feb 2020 15:20
Last Modified: 16 Oct 2024 11:06
Status: Published
Open Archives Initiative ID (OAI ID):

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Filename: PID6349913.pdf

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