An interlaboratory study of the reproducibility of on-wafer S-parameter measurements from 140 GHz to 220 GHz

Clarke, RG orcid.org/0000-0002-4400-8464, Shang, X, Ridler, NM et al. (3 more authors) (2020) An interlaboratory study of the reproducibility of on-wafer S-parameter measurements from 140 GHz to 220 GHz. In: Proceedings of the 94th ARFTG Microwave Measurement Symposium (ARFTG 2020). 94th ARFTG Microwave Measurement Symposium (ARFTG 2020), 26-29 Jan 2020, San Antonio, Texas, USA. IEEE ISBN 978-1-7281-2056-0

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Item Type: Proceedings Paper
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Keywords: On-wafer measurement; co-planar waveguide; measurement repeatability; measurement reproducibility; measurement uncertainty
Dates:
  • Accepted: 28 October 2019
  • Published (online): 20 April 2020
  • Published: 20 April 2020
Institution: The University of Leeds
Academic Units: The University of Leeds > Faculty of Engineering & Physical Sciences (Leeds) > School of Electronic & Electrical Engineering (Leeds) > Pollard Institute (Leeds)
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European Association of National Metrology Institutes
14IND02
Depositing User: Symplectic Publications
Date Deposited: 03 Feb 2020 12:54
Last Modified: 08 Jun 2020 14:58
Status: Published
Publisher: IEEE
Identification Number: 10.1109/ARFTG47584.2020.9071783
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