Luo, P., Madathil, S.N.E. orcid.org/0000-0001-6832-1300, Nishizawa, S.-I. et al. (1 more author) (2020) High dV/dt controllability of 1.2kV Si-TCIGBT for high flexibility design with ultra-low loss operation. In: Proceedings of 2020 IEEE Applied Power Electronics Conference and Exposition (APEC). 2020 IEEE Applied Power Electronics Conference and Exposition (APEC), 15-19 Mar 2020, New Orleans, LA, USA. Institute of Electrical and Electronics Engineers (IEEE) , pp. 686-689. ISBN 9781728148304
Abstract
High dV/dt controllability of IGBT is an important factor for flexible design as well as low switching loss in power electronics systems. However, Dynamic Avalanche (DA) phenomenon poses a fundamental limit on their dV/dt control range, operating current density, turn-off power loss as well as reliability. Overcoming this phenomenon is essential to ensure their safe operation and high robustness in emerging electric transport. In this work, detailed analysis of 1.2 kV trench gated IGBTs is undertaken through experiments and calibrated TCAD 3-dimensional simulations to show the fundamental cause of the low dV/dt controllability of conventional IGBTs and a method to achieve DA free design by Trench Clustered IGBT (TCIGBT). The potential of TCIGBT for ultra-high current density operation with high dV/dt controllability is also presented.
Metadata
Item Type: | Proceedings Paper |
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Authors/Creators: |
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Copyright, Publisher and Additional Information: | © 2020 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other users, including reprinting/ republishing this material for advertising or promotional purposes, creating new collective works for resale or redistribution to servers or lists, or reuse of any copyrighted components of this work in other works. Reproduced in accordance with the publisher's self-archiving policy. |
Keywords: | IGBT; CIGBT; dynamic avalanche; dv/dt controllability; high current density operation |
Dates: |
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Institution: | The University of Sheffield |
Academic Units: | The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Electronic and Electrical Engineering (Sheffield) |
Depositing User: | Symplectic Sheffield |
Date Deposited: | 20 Nov 2019 10:00 |
Last Modified: | 25 Jun 2021 00:38 |
Status: | Published |
Publisher: | Institute of Electrical and Electronics Engineers (IEEE) |
Refereed: | Yes |
Identification Number: | 10.1109/APEC39645.2020.9124293 |
Related URLs: | |
Open Archives Initiative ID (OAI ID): | oai:eprints.whiterose.ac.uk:153669 |