Tian, H., Liao, X., Wang, Y. et al. (4 more authors) (2019) Effect level based parameterization method for diffuse scattering models at millimeter-wave frequencies. IEEE Access, 7. pp. 93286-93293. ISSN 2169-3536
Abstract
This paper proposes a multi-coefficient estimation method for the dielectric parameters of rough materials and an effect level-based parameterization method for diffuse scattering models to characterize and model the diffuse scattering propagation at millimeter-wave frequencies. A series of diffuse scattering propagation measurements and simulations for rough materials have been performed at 40-50 GHz in a typical indoor scenario. Theoretical reflection coefficient, transmission coefficient, and scattering coefficient of rough materials, which are requisite for the proposed estimation method, are derived based on the Fresnel theoretical model and the Gaussian rough surface model. The directive model and double-lobe model are chosen and integrated with ray tracing tool to simulate the diffuse multipath propagation for rough materials based on effect level evaluation results. The optimal model parameters are obtained and various simulation results are compared and in particular, the estimated ranges of scattering coefficients agree well with the measured values. The investigations demonstrate that the proposed parameterization method is reliable and accurate for the diffuse scattering models and can be applied for the determination of model parameters from extensive materials measurement data, especially for millimeter-wave channel analysis and modeling.
Metadata
Item Type: | Article |
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Authors/Creators: |
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Copyright, Publisher and Additional Information: | © 2019 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other users, including reprinting/ republishing this material for advertising or promotional purposes, creating new collective works for resale or redistribution to servers or lists, or reuse of any copyrighted components of this work in other works. Reproduced in accordance with the publisher's self-archiving policy. |
Keywords: | Millimeter-wave; diffuse scattering; model parameterization; effect level; propagation coefficients; rough materials |
Dates: |
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Institution: | The University of Sheffield |
Academic Units: | The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Electronic and Electrical Engineering (Sheffield) |
Depositing User: | Symplectic Sheffield |
Date Deposited: | 13 Nov 2019 11:34 |
Last Modified: | 13 Nov 2019 11:34 |
Status: | Published |
Publisher: | Institute of Electrical and Electronics Engineers (IEEE) |
Refereed: | Yes |
Identification Number: | 10.1109/access.2019.2927612 |
Related URLs: | |
Open Archives Initiative ID (OAI ID): | oai:eprints.whiterose.ac.uk:153311 |