Baggott, A., Mazaheri, M. and Inkson, B.J. orcid.org/0000-0002-2631-9090 (2019) 3D characterisation of indentation induced sub-surface cracking in silicon nitride using FIB tomography. Journal of the European Ceramic Society, 39 (13). pp. 3620-3626. ISSN 0955-2219
Abstract
In this study, a combination of 3D FIB tomography and incremental surface polishing has been used to characterize cracking beneath 0.5 kg and 1 kg Vickers indentations on silicon nitride. It is shown that a half-penny cracking regime exists even for low indentation loads with c/a ratios < 2 indicating that the c/a ratio cannot reliably be used to predict sub-surface crack morphology. For the first time, the presence of deep lateral cracks interconnected with radial cracks was also observed surrounding indentations of low loads on silicon nitride, and it is likely that these could contribute to material removal via spalling.
Metadata
Item Type: | Article |
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Authors/Creators: |
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Copyright, Publisher and Additional Information: | © 2019 The Authors. Published by Elsevier Ltd. This is an open access article under the CC BY license (http://creativecommons.org/licenses/BY/4.0/). |
Keywords: | Focused ion beam (FIB) tomography; Silicon nitride; Cracking; Microindentation |
Dates: |
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Institution: | The University of Sheffield |
Academic Units: | The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Materials Science and Engineering (Sheffield) |
Depositing User: | Symplectic Sheffield |
Date Deposited: | 09 Jul 2019 13:54 |
Last Modified: | 10 Jul 2019 21:42 |
Status: | Published |
Publisher: | Elsevier |
Refereed: | Yes |
Identification Number: | 10.1016/j.jeurceramsoc.2019.05.012 |
Open Archives Initiative ID (OAI ID): | oai:eprints.whiterose.ac.uk:148195 |
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