Xue, S., Zhu, Z.Q. orcid.org/0000-0001-7175-3307, Wang, Y. et al. (5 more authors) (2018) Thermal-loss coupling analysis of an electrical machine using the improved temperature-dependent iron loss model. IEEE Transactions on Magnetics, 54 (11). 8105005. ISSN 0018-9464
Abstract
In this paper, the iron loss models for electrical machines are first reviewed. One of the most accurate iron loss models, when the temperature is constant, is identified. An improved temperature-dependent iron loss model is also introduced. By applying the improved iron loss model to the electrical machine thermal analysis, the thermal and loss analyses can be fully coupled. Based on this, an improved thermal-loss coupling analysis method for electrical machine is developed in this paper. The electrical machine iron loss tests are carried out. The analysis and measurement results are then compared in order to validate the improved thermal-loss coupling analysis method. The comparison results indicate that the temperature prediction accuracy can be significantly improved by using the improved thermal-loss coupling analysis method.
Metadata
Item Type: | Article |
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Authors/Creators: |
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Copyright, Publisher and Additional Information: | © 2018 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other users, including reprinting/ republishing this material for advertising or promotional purposes, creating new collective works for resale or redistribution to servers or lists, or reuse of any copyrighted components of this work in other works. Reproduced in accordance with the publisher's self-archiving policy. |
Keywords: | Electrical machine; iron loss; temperature; thermal analysis |
Dates: |
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Institution: | The University of Sheffield |
Academic Units: | The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Electronic and Electrical Engineering (Sheffield) |
Depositing User: | Symplectic Sheffield |
Date Deposited: | 03 Dec 2018 12:49 |
Last Modified: | 03 Dec 2018 12:49 |
Published Version: | https://doi.org/10.1109/TMAG.2018.2842708 |
Status: | Published |
Publisher: | Institute of Electrical and Electronics Engineers |
Refereed: | Yes |
Identification Number: | 10.1109/TMAG.2018.2842708 |
Related URLs: | |
Open Archives Initiative ID (OAI ID): | oai:eprints.whiterose.ac.uk:139337 |