Mishra, B (2017) Applications of x-ray Raman scattering for in-situ material charecterization. In: 253rd National Meeting of the American-Chemical-Society (ACS) on Advanced Materials, Technologies, Systems, and Processes, 02-06 Apr 2017, San Francisco, CA.
Metadata
| Item Type: | Conference or Workshop Item |
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| Authors/Creators: |
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| Dates: |
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| Institution: | The University of Leeds |
| Academic Units: | The University of Leeds > Faculty of Engineering & Physical Sciences (Leeds) > School of Chemical & Process Engineering (Leeds) |
| Depositing User: | Symplectic Publications |
| Date Deposited: | 12 Nov 2018 09:20 |
| Last Modified: | 12 Nov 2018 09:20 |
| Status: | Published |
| Related URLs: | |
| Open Archives Initiative ID (OAI ID): | oai:eprints.whiterose.ac.uk:137811 |
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