Padilha, A. C. M. and McKenna, K. P. orcid.org/0000-0003-0975-3626 (2018) Structure and properties of a model conductive filament/host oxide interface in HfO2-based ReRAM. PHYSICAL REVIEW MATERIALS. 45001. ISSN 2475-9953
Metadata
Item Type: | Article |
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Authors/Creators: |
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Copyright, Publisher and Additional Information: | © 2018, The Author(s). |
Dates: |
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Institution: | The University of York |
Academic Units: | The University of York > Faculty of Sciences (York) > Physics (York) |
Funding Information: | Funder Grant number EPSRC EP/P023843/1 EPSRC EP/K003151/1 |
Depositing User: | Pure (York) |
Date Deposited: | 09 Jul 2018 16:20 |
Last Modified: | 10 Nov 2024 01:21 |
Published Version: | https://doi.org/10.1103/PhysRevMaterials.2.045001 |
Status: | Published |
Refereed: | Yes |
Identification Number: | 10.1103/PhysRevMaterials.2.045001 |
Open Archives Initiative ID (OAI ID): | oai:eprints.whiterose.ac.uk:133126 |