Femtosecond X-Ray Diffraction Studies of the Reversal of the Microstructural Effects of Plastic Deformation during Shock Release of Tantalum

Sliwa, M., McGonegle, David, Wehrenberg, C. E. et al. (14 more authors) (2018) Femtosecond X-Ray Diffraction Studies of the Reversal of the Microstructural Effects of Plastic Deformation during Shock Release of Tantalum. Physical Review Letters. 265502. ISSN 1079-7114

Abstract

Metadata

Item Type: Article
Authors/Creators:
  • Sliwa, M.
  • McGonegle, David
  • Wehrenberg, C. E.
  • Bolme, C.
  • Heighway, Patrick
  • Higginbotham, Andrew ORCID logo https://orcid.org/0000-0001-5211-9933
  • Lazicki, A. E.
  • Lee, Hae Ja
  • Nagler, Bob
  • Park, H. S.
  • Rudd, R. E.
  • Suggit, Matthew J.
  • Swift, D. C.
  • Tavella, F.
  • Zepeda-Ruiz, L.
  • Remington, Bruce A.
  • Wark, J S
Copyright, Publisher and Additional Information:

© 2018 American Physical Society. This is an author-produced version of the published paper. Uploaded in accordance with the publisher’s self-archiving policy. Further copying may not be permitted; contact the publisher for details

Dates:
  • Published: 29 June 2018
  • Accepted: 18 April 2018
Institution: The University of York
Academic Units: The University of York > Faculty of Sciences (York) > Physics (York)
Depositing User: Pure (York)
Date Deposited: 03 Jul 2018 08:30
Last Modified: 16 Oct 2024 14:41
Published Version: https://doi.org/10.1103/PhysRevLett.120.265502
Status: Published
Refereed: Yes
Identification Number: 10.1103/PhysRevLett.120.265502
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Open Archives Initiative ID (OAI ID):

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