Growth and characterisation of ferromagnetic and antiferromagnetic Fe 2+xV yAl Heusler alloy films

Abstract

We investigated growth, annealing conditions and magnetic properties of the Heusler alloy Fe 2+xV yAl by means of x-ray diffraction, magnetic hysteresis and exchange-bias measurements. Ferromagnetic Heusler alloy films were obtained by sputtering Fe 2VAl and Fe 3VAl targets and performing post-growth annealing. The characteristic (2 2 0) Heusler alloy peaks were seen in the x-ray diffraction measurements and corresponding ferromagnetic behaviours were observed. In addition, antiferromagnetic Heusler alloy films were deposited by employing Al pegs on Fe 3VAl sputtering targets. The deposited films had elemental ratios close to the predicted Fe 2.5V 0.5Al phase, and a 16 Oe exchange-bias was measured in a Fe 2.3V 0.7Al/Co 60Fe 40 system at 100 K.

Metadata

Item Type:	Article
Authors/Creators:	Huminiuc, Teodor Whear, Oliver Samuel Takahashi, Tomoyuki Kim, Jun-Young https://orcid.org/0000-0002-1639-3270 Vick, Andrew James Vallejo Fernandez, Gonzalo https://orcid.org/0000-0002-4826-1547 O'Grady, Kevin Dermot https://orcid.org/0000-0002-4837-3709 Hirohata, Atsufumi https://orcid.org/0000-0001-9107-2330
Keywords:	Fe2VAl,Heusler alloys,antiferromagnet,exchange bias,spintronics,sputtering,x-ray diffraction
Dates:	Accepted: 25 June 2018 Published: 13 July 2018
Institution:	The University of York
Academic Units:	The University of York > Faculty of Sciences (York) > Electronic Engineering (York) The University of York > Faculty of Sciences (York) > Physics (York)
Depositing User:	Pure (York)
Date Deposited:	26 Jun 2018 09:00
Last Modified:	09 Apr 2025 23:17
Published Version:	https://doi.org/10.1088/1361-6463/aacf4c
Status:	Published
Refereed:	Yes
Identification Number:	10.1088/1361-6463/aacf4c
Related URLs:	http://www.scopus.com/inward/record.url?...
Open Archives Initiative ID (OAI ID):	oai:eprints.whiterose.ac.uk:132606