Huminiuc, Teodor, Whear, Oliver Samuel, Takahashi, Tomoyuki et al. (5 more authors) (2018) Growth and characterisation of ferromagnetic and antiferromagnetic Fe 2+xV yAl Heusler alloy films. Journal of Physics D: Applied Physics. 325003. ISSN 1361-6463
Abstract
We investigated growth, annealing conditions and magnetic properties of the Heusler alloy Fe 2+xV yAl by means of x-ray diffraction, magnetic hysteresis and exchange-bias measurements. Ferromagnetic Heusler alloy films were obtained by sputtering Fe 2VAl and Fe 3VAl targets and performing post-growth annealing. The characteristic (2 2 0) Heusler alloy peaks were seen in the x-ray diffraction measurements and corresponding ferromagnetic behaviours were observed. In addition, antiferromagnetic Heusler alloy films were deposited by employing Al pegs on Fe 3VAl sputtering targets. The deposited films had elemental ratios close to the predicted Fe 2.5V 0.5Al phase, and a 16 Oe exchange-bias was measured in a Fe 2.3V 0.7Al/Co 60Fe 40 system at 100 K.
Metadata
Item Type: | Article |
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Authors/Creators: |
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Keywords: | Fe2VAl,Heusler alloys,antiferromagnet,exchange bias,spintronics,sputtering,x-ray diffraction |
Dates: |
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Institution: | The University of York |
Academic Units: | The University of York > Faculty of Sciences (York) > Electronic Engineering (York) The University of York > Faculty of Sciences (York) > Physics (York) |
Depositing User: | Pure (York) |
Date Deposited: | 26 Jun 2018 09:00 |
Last Modified: | 01 Dec 2024 01:11 |
Published Version: | https://doi.org/10.1088/1361-6463/aacf4c |
Status: | Published |
Refereed: | Yes |
Identification Number: | 10.1088/1361-6463/aacf4c |
Related URLs: | |
Open Archives Initiative ID (OAI ID): | oai:eprints.whiterose.ac.uk:132606 |
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Description: Huminiuc_2018_J._Phys._D__Appl._Phys._51_325003
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