Robinson, M.P. orcid.org/0000-0003-1767-5541, Benson, T.M., Christopoulos, C. et al. (6 more authors) (1998) Effect of logic family on radiated emissions from digital circuits. IEEE Transactions on Electromagnetic Compatibility. pp. 288-293.
Abstract
Radiated emissions were measured for simple digital circuits designed to operate with various logic families. Emissions in the near and far field were found to depend both on the circuit layout and the choice of logic family. However, the difference in peak emissions between any two logic families was found to be independent of circuit layout. The greatest difference in peak emissions was between high-speed 74ACT logic and low-speed 4000 CMOS logic devices, with a mean value of approximately 20 dB. Emissions from a more complex circuit were compared with the measurements on simple loop circuits. Test circuits were used to measure the propagation delay, the rise and fall times, the maximum operating frequency and the transient switching currents between two successive logic gates for each logic family. Empirical formulas have been derived that relate relative peak emissions to these switching parameters. It is hoped that these will assist designers to assess the effect of choice of logic family on electromagnetic compatibility.
Metadata
Item Type: | Article |
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Authors/Creators: |
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Keywords: | digital circuits,electromagnetic compatibility,electromagnetic interference,logic circuits,radiated emissions |
Dates: |
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Institution: | The University of York |
Academic Units: | The University of York > Faculty of Sciences (York) > Electronic Engineering (York) |
Depositing User: | Pure (York) |
Date Deposited: | 22 Jun 2018 09:30 |
Last Modified: | 21 Jan 2025 17:15 |
Published Version: | https://doi.org/10.1109/15.709429 |
Status: | Published |
Refereed: | Yes |
Identification Number: | 10.1109/15.709429 |
Open Archives Initiative ID (OAI ID): | oai:eprints.whiterose.ac.uk:132451 |
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