Qiao, L., Dimler, S.J., Baharuddin, A.N.A.P. et al. (2 more authors) (2018) An excess noise measurement system for weak responsivity avalanche photodiodes. Measurement Science and Technology, 29 (6). 065015. ISSN 0957-0233
Abstract
A system for measuring, with reduced photocurrent, the excess noise associated with the gain in avalanche photodiodes (APDs), using a transimpedance amplifier front-end and based on phase-sensitive detection is described. The system can reliably measure the excess noise power of devices, even when the un-multiplied photocurrent is low (~10 nA). This is more than one order of magnitude better than previously reported systems and represents a significantly better noise signal to noise ratio. This improvement in performance has been achieved by increasing the value of the feedback resistor and reducing the op-amp bandwidth. The ability to characterise APD performance with such low photocurrents enables the use of low power light sources such as light emitting diode rather than lasers to investigate the APD noise performance.
Metadata
Item Type: | Article |
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Authors/Creators: |
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Copyright, Publisher and Additional Information: | © 2018 IOP Publishing. This is an author produced version of a paper subsequently published in Measurement Science and Technology. Uploaded in accordance with the publisher's self-archiving policy. |
Keywords: | avalanche photodiode; excess noise; noise measurement |
Dates: |
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Institution: | The University of Sheffield |
Academic Units: | The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Electronic and Electrical Engineering (Sheffield) |
Depositing User: | Symplectic Sheffield |
Date Deposited: | 08 Jun 2018 13:40 |
Last Modified: | 15 May 2019 00:41 |
Published Version: | https://doi.org/10.1088/1361-6501/aabc8b |
Status: | Published |
Publisher: | IOP Publishing |
Refereed: | Yes |
Identification Number: | 10.1088/1361-6501/aabc8b |
Related URLs: | |
Open Archives Initiative ID (OAI ID): | oai:eprints.whiterose.ac.uk:131582 |