Baggott, A., Mazaheri, M., Zhou, Y. et al. (2 more authors) (2018) A comparison of He and Ne FIB imaging of cracks in microindented silicon nitride. Materials Characterization, 141. pp. 362-369. ISSN 1044-5803
Abstract
Helium ion microscopy (HIM) offers potential as a high spatial resolution technique for imaging insulating samples that are susceptible to charging artifacts. In this study helium and neon ion microscopy are used to image cracking in microindented samples of the non-conductive ceramic silicon nitride. The crack morphology of radial cracks emanating from the microindentations has been characterized for two different compositions of silicon nitride, with and without conductive coatings. Gold coating enhances crack edge contrast, but masks grain contrast for both He and Ne ion-induced secondary electron (ISE) imaging. Carbon coating enables the crystalline and glassy phases to be distinguished, more clearly with Ne-ISE, and the cracking pathway is found to be primarily intergranular. Zones of < 100 nm diameter depleted ion-induced secondary electron emission along the crack paths are identified, consistent with charging ‘hotspots’.
Metadata
Item Type: | Article |
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Authors/Creators: |
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Copyright, Publisher and Additional Information: | © 2018 The Authors. Published by Elsevier Inc. This is an open access article under the CC BY license (http://creativecommons.org/licenses/BY/4.0/). |
Dates: |
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Institution: | The University of Sheffield |
Academic Units: | The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Materials Science and Engineering (Sheffield) |
Funding Information: | Funder Grant number LEVERHULME TRUST (THE) IN-2016-027 SKF B.V. URMS 145478 |
Depositing User: | Symplectic Sheffield |
Date Deposited: | 05 Jun 2018 15:29 |
Last Modified: | 06 Jun 2018 12:12 |
Published Version: | https://doi.org/10.1016/j.matchar.2018.05.006 |
Status: | Published |
Publisher: | Elsevier |
Refereed: | Yes |
Identification Number: | 10.1016/j.matchar.2018.05.006 |
Open Archives Initiative ID (OAI ID): | oai:eprints.whiterose.ac.uk:131350 |
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