Praena, J., Ferrer, F. J., Vollenberg, W. et al. (47 more authors) (2018) Preparation and characterization of 33S samples for 33S(n,α)30Si cross-section measurements at the n_TOF facility at CERN. Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. pp. 142-147. ISSN 0168-9002
Abstract
Thin 33S samples for the study of the 33S(n,α)30Si cross-section at the n_TOF facility at CERN were made by thermal evaporation of 33S powder onto a dedicated substrate made of kapton covered with thin layers of copper, chromium and titanium. This method has provided for the first time bare sulfur samples a few centimeters in diameter. The samples have shown an excellent adherence with no mass loss after few years and no sublimation in vacuum at room temperature. The determination of the mass thickness of 33S has been performed by means of Rutherford backscattering spectrometry. The samples have been successfully tested under neutron irradiation.
Metadata
Item Type: | Article |
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Authors/Creators: |
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Copyright, Publisher and Additional Information: | © 2018 The Authors. |
Keywords: | Neutron induced alpha emission,Rutherford backscattering,Thermal evaporation |
Dates: |
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Institution: | The University of York |
Academic Units: | The University of York The University of York > Faculty of Sciences (York) > Physics (York) The University of York > Faculty of Arts and Humanities (York) > History (York) |
Depositing User: | Pure (York) |
Date Deposited: | 25 May 2018 08:50 |
Last Modified: | 16 Oct 2024 14:45 |
Published Version: | https://doi.org/10.1016/j.nima.2018.02.055 |
Status: | Published |
Refereed: | Yes |
Identification Number: | 10.1016/j.nima.2018.02.055 |
Related URLs: | |
Open Archives Initiative ID (OAI ID): | oai:eprints.whiterose.ac.uk:131327 |
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