Roesgaard, S, Ramasse, Q orcid.org/0000-0001-7466-2283, Chevallier, J et al. (2 more authors) (2018) Electron energy-loss spectroscopy of single nanocrystals: Mapping of tin allotropes. Nanotechnology, 29 (21). 215707. ISSN 0957-4484
Abstract
Using monochromated electron energy-loss spectroscopy (EELS), we are able to map different allotropes in Sn-nanocrystals embedded in Si. It is demonstrated that α-Sn and β-Sn, as well as an interface related plasmon, can be distinguished in embedded Sn-nanostructures. The EELS data is interpreted by standard non-negative matrix factorization followed by a manual Lorentzian decomposition. The decomposition allows for a more physical understanding of the EELS mapping without reducing the level of information. Extending the analysis from a reference system to smaller nanocrystals demonstrates that allotrope determination in nanoscale systems down below 5 nm is possible. Such local information proves the use of monochromated EELS mapping as a powerful technique to study nanoscale systems. This possibility enables investigation of small nanostructures that cannot be investigated through other means, allowing for a better understanding and thus leading to realizations that can result in nanomaterials with improved properties.
Metadata
Item Type: | Article |
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Authors/Creators: |
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Keywords: | electron energy-loss spectroscopy, tin nanocrystals, scanning transmission electron microscopy, principal component analysis, non-negative matrix factorization, plasmons |
Dates: |
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Institution: | The University of Leeds |
Academic Units: | The University of Leeds > Faculty of Engineering & Physical Sciences (Leeds) > School of Chemical & Process Engineering (Leeds) |
Depositing User: | Symplectic Publications |
Date Deposited: | 03 May 2018 11:06 |
Last Modified: | 21 May 2018 13:03 |
Status: | Published |
Publisher: | IOP Publishing |
Identification Number: | 10.1088/1361-6528/aab563 |
Open Archives Initiative ID (OAI ID): | oai:eprints.whiterose.ac.uk:130392 |