Walther, T. orcid.org/0000-0003-3571-6263, Dunin-Borkowski, R.E., Rouviere, J.-L. et al. (1 more author) (2017) Aberration Corrected Transmission Electron Microscopy. Journal Of Materials Research, 32 (5). p. 911. ISSN 0884-2914
Metadata
Item Type: | Article |
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Authors/Creators: |
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Copyright, Publisher and Additional Information: | © Materials Research Society 2017. This article has been published in a revised form in Journal of Materials Research https://doi.org/10.1557/jmr.2017.74. This version is free to view and download for private research and study only. Not for re-distribution, re-sale or use in derivative works. |
Dates: |
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Institution: | The University of Sheffield |
Academic Units: | The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Electronic and Electrical Engineering (Sheffield) |
Depositing User: | Symplectic Sheffield |
Date Deposited: | 11 Apr 2018 10:59 |
Last Modified: | 13 Apr 2018 13:41 |
Published Version: | https://doi.org/10.1557/jmr.2017.74 |
Status: | Published |
Publisher: | Materials Research Society |
Refereed: | Yes |
Identification Number: | 10.1557/jmr.2017.74 |
Related URLs: | |
Open Archives Initiative ID (OAI ID): | oai:eprints.whiterose.ac.uk:129401 |