Impagnatiello, A, Hernandez-Maldonado, D, Bertali, G et al. (5 more authors) (2017) Atomically resolved chemical ordering at the nm-thick TiO precipitate/matrix interface in V-4Ti-4Cr alloy. Scripta Materialia, 126. pp. 50-54. ISSN 1359-6462
Abstract
We have used advanced analytical electron microscopy to characterise the local structure and chemistry at the interface between nm-thick TiO precipitates and the V-based matrix in a V-4Ti-4Cr alloy. Our results reveal the presence of an intergrowth between the fcc TiO and bcc vanadium structures, with a repeat lattice distance that equals 2.5 times the vanadium lattice parameter along the c-axis. Our atomic resolution analysis of the interface will impact the mechanistic understanding of its interaction with interstitials and radiation-induced lattice defects, and consequently trigger the development of improved alloy structures with interfaces engineered for enhanced radiation tolerance.
Metadata
Item Type: | Article |
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Authors/Creators: |
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Copyright, Publisher and Additional Information: | (c) 2016, Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved. This is an author produced version of a paper published in Scripta Materialia. Uploaded in accordance with the publisher's self-archiving policy. |
Keywords: | Refractory metal; Crystalline oxides; Lattice defects; High-resolution electron microscopy; Nuclear fusion reactor |
Dates: |
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Institution: | The University of Leeds |
Academic Units: | The University of Leeds > Faculty of Engineering & Physical Sciences (Leeds) > School of Chemical & Process Engineering (Leeds) |
Depositing User: | Symplectic Publications |
Date Deposited: | 05 Apr 2018 16:02 |
Last Modified: | 05 Apr 2018 16:02 |
Status: | Published |
Publisher: | Elsevier |
Identification Number: | 10.1016/j.scriptamat.2016.08.016 |
Related URLs: | |
Open Archives Initiative ID (OAI ID): | oai:eprints.whiterose.ac.uk:129265 |