Stange, D, Von den Driesch, N, Rainko, D et al. (10 more authors) (2018) Quantum Confinement Effects in GeSn/SiGeSn Heterostructure Lasers. In: Proceedings of IEDM 2017. 2017 IEEE International Electron Devices Meeting, 02-06 Dec 2017, San Francisco, CA, USA. IEEE , pp. 589-592. ISBN 978-1-5386-3559-9
Abstract
The development of a light source on Si, which can be integrated in photonic circuits together with CMOS electronics, is an outstanding goal in the field of Silicon photonics. This could e.g. help to overcome bandwidth limitations and losses of copper interconnects as the number of high-speed transistors on a chip increases. Here, we discuss direct bandgap group IV materials, GeSn/SiGeSn heterostructures and resulting quantum confinement effects for laser implementation. After material characterization, optical properties, including lasing, are probed via photoluminescence spectrometry. The quantum confinement effect in GeSn wells of different thicknesses is investigated. Theoretical calculations show strong quantum confinement to be undesirable past a certain level, as the very different effective masses of r and L electrons lead to a decrease of the L-to Γ-valley energy difference. A main limiting factor for lasing devices turns out to be the defective region at the interface to the Ge substrate due to the high lattice mismatch to GeSn. The use of buffer technology and subsequent pseudomorphic growth of multi-quantum-wells structures offers confinement of carriers in the active material, far from the misfit dislocations region. Performance is strongly boosted, as a reduction of lasing thresholds from 300 kW/cm2 for bulk devices to below 45 kW/cm2 in multi-quantum-well lasers is observed at low temperatures, with the reduction in threshold far outpacing the reduction in active gain material volume.
Metadata
Item Type: | Proceedings Paper |
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Authors/Creators: |
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Copyright, Publisher and Additional Information: | U.S. Government work not protected by U.S. copyright. This is an author produced version of a paper published in the Proceedings of 2017 IEEE International Electron Devices Meeting (IEDM). Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. Uploaded in accordance with the publisher's self-archiving policy. |
Dates: |
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Institution: | The University of Leeds |
Depositing User: | Symplectic Publications |
Date Deposited: | 08 Mar 2018 14:34 |
Last Modified: | 20 Mar 2018 20:26 |
Status: | Published |
Publisher: | IEEE |
Identification Number: | 10.1109/IEDM.2017.8268451 |
Open Archives Initiative ID (OAI ID): | oai:eprints.whiterose.ac.uk:128331 |