Xue, S., Feng, J., Guo, S. et al. (3 more authors) (2018) A New Iron Loss Model for Temperature Dependencies of Hysteresis and Eddy Current Losses in Electrical Machines. IEEE Transactions on Magnetics, 54 (1). 8100310. ISSN 0018-9464
Abstract
In this paper, the different temperature dependencies of hysteresis and eddy current losses of non-oriented Si-steel laminations are investigated. The measured iron loss results show that both the hysteresis and eddy current losses vary linearly with temperature between 40 °C to 100 °C, a typical temperature range of electrical machines. Varying rates of hysteresis and eddy current losses with the temperature are different and fluctuate with flux density and frequency. Based on this, an improved iron loss model which can consider temperature dependencies of hysteresis and eddy current losses separately is developed. Based on the improved iron loss model, the temperature influence on the iron loss can be fully considered by measuring iron losses at only two different temperatures. The investigation is experimentally validated by both the tests based on a ring specimen and an electrical machine.
Metadata
Item Type: | Article |
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Authors/Creators: |
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Copyright, Publisher and Additional Information: | © 2018 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other users, including reprinting/ republishing this material for advertising or promotional purposes, creating new collective works for resale or redistribution to servers or lists, or reuse of any copyrighted components of this work in other works. Reproduced in accordance with the publisher's self-archiving policy. |
Keywords: | Eddy current loss; electrical machines; hysteresis loss; iron loss; temperature dependence |
Dates: |
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Institution: | The University of Sheffield |
Academic Units: | The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Electronic and Electrical Engineering (Sheffield) |
Depositing User: | Symplectic Sheffield |
Date Deposited: | 07 Mar 2018 11:15 |
Last Modified: | 28 Jun 2018 15:02 |
Published Version: | https://doi.org/10.1109/TMAG.2017.2755593 |
Status: | Published |
Publisher: | Institute of Electrical and Electronics Engineers |
Refereed: | Yes |
Identification Number: | 10.1109/TMAG.2017.2755593 |
Related URLs: | |
Open Archives Initiative ID (OAI ID): | oai:eprints.whiterose.ac.uk:128254 |