Glover, Stephanie Elizabeth, Saerbeck, Thomas, Kuerbanjiang, Balati orcid.org/0000-0001-6446-8209 et al. (8 more authors) (2018) Magnetic and structural depth profiles of Heusler alloy Co2FeAl0.5Si0.5 epitaxial films on Si(111). Journal of Physics: Condensed Matter. ISSN 1361-648X
Abstract
The depth-resolved chemical structure and magnetic moment of Co<sub>2</sub>FeAl<sub>0.5</sub>Si<sub>0.5</sub> thin films grown on Si(111) have been determined using x-ray and polarized neutron reflectometry. Bulk-like magnetization is retained across the majority of the film, but reduced moments are observed within 45 Å of the surface and in a 25 Å substrate interface region. The reduced moment is related to with compositional changes due to oxidation and diffusion, which are further quantified by elemental profiling using electron microscopy with electron energy loss spectroscopy. The accuracy of structural and magnetic depth-profiles obtained from simultaneous modeling is discussed using different approaches with different degree of constraints on the parameters. Our approach illustrates the challenges in fitting reflectometry data from these multi-component quaternary Heusler alloy thin films.
Metadata
Item Type: | Article |
---|---|
Authors/Creators: |
|
Copyright, Publisher and Additional Information: | © 2018 IOP Publishing Ltd. |
Dates: |
|
Institution: | The University of York |
Academic Units: | The University of York > Faculty of Sciences (York) > Physics (York) |
Depositing User: | Pure (York) |
Date Deposited: | 10 Jan 2018 12:00 |
Last Modified: | 26 Nov 2024 00:36 |
Published Version: | https://doi.org/10.1088/1361-648X/aaa4c8 |
Status: | Published online |
Refereed: | Yes |
Identification Number: | 10.1088/1361-648X/aaa4c8 |
Open Archives Initiative ID (OAI ID): | oai:eprints.whiterose.ac.uk:126106 |
Download
Filename: Glover_et_al_2018_J._Phys._3A_Condens._Matter_10.1088_1361_648X_aaa4c8.pdf
Description: Magnetic and structural depth profiles of Heusler alloy Co2 FeAl0.5Si0.5 epitaxial films on Si(111)