Almeida, TP, McGrouther, D, Pivak, Y et al. (5 more authors) (2017) Preparation of high-quality planar FeRh thin films for in situ TEM investigations. In: Journal of Physics: Conference Series. 8th Joint European Magnetic Symposia (JEMS2016), 21-26 Aug 2016, Glasgow, UK. IOP Publishing
Abstract
The preparation of a planar FeRh thin film using a focused ion beam (FIB) secondary electron microscope (SEM) for the purpose of in situ transmission electron microscopy (TEM) is presented. A custom SEM stub with 45° faces allows for the transfer and milling of the sample on a TEM heating chip, whilst Fresnel imaging within the TEM revealed the presence of the magnetic domain walls, confirming the quality of the FIB-prepared sample.
Metadata
Item Type: | Proceedings Paper |
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Authors/Creators: |
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Copyright, Publisher and Additional Information: | Published under licence by IOP Publishing Ltd. Content from this work may be used under the terms of the Creative Commons Attribution 3.0 licence [https://creativecommons.org/licenses/by/3.0/]. Any further distribution of this work must maintain attribution to the author(s) and the title of the work, journal citation and DOI. |
Dates: |
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Institution: | The University of Leeds |
Academic Units: | The University of Leeds > Faculty of Engineering & Physical Sciences (Leeds) > School of Physics and Astronomy (Leeds) > Condensed Matter (Leeds) |
Depositing User: | Symplectic Publications |
Date Deposited: | 11 Dec 2017 16:07 |
Last Modified: | 15 Dec 2017 12:07 |
Status: | Published |
Publisher: | IOP Publishing |
Identification Number: | 10.1088/1742-6596/903/1/012022 |
Open Archives Initiative ID (OAI ID): | oai:eprints.whiterose.ac.uk:125076 |