Walther, T. orcid.org/0000-0003-3571-6263 and Jones, L. (2017) Preface to special issue on Microscopy of Semiconducting Materials 2017 (MSM-XX). Journal of Microscopy, 268 (3). pp. 221-224. ISSN 0022-2720
Metadata
Item Type: | Article |
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Authors/Creators: |
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Copyright, Publisher and Additional Information: | © 2017 The Authors. This is an author produced version of a paper subsequently published in Journal of Microscopy. Uploaded in accordance with the publisher's self-archiving policy. |
Dates: |
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Institution: | The University of Sheffield |
Academic Units: | The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Electronic and Electrical Engineering (Sheffield) |
Depositing User: | Symplectic Sheffield |
Date Deposited: | 01 Dec 2017 12:39 |
Last Modified: | 20 Nov 2018 01:38 |
Published Version: | https://doi.org/10.1111/jmi.12665 |
Status: | Published |
Publisher: | Wiley |
Refereed: | Yes |
Identification Number: | 10.1111/jmi.12665 |
Related URLs: | |
Open Archives Initiative ID (OAI ID): | oai:eprints.whiterose.ac.uk:124677 |