Uddin, SZ and Talukder, MA orcid.org/0000-0002-2814-3658 (2017) Two-dimensional materials for improved resolution in total internal reflection fluorescence microscopy. Materials Research Express, 4 (9). 096203. ISSN 2053-1591
Abstract
We propose and theoretically demonstrate that two-dimensional materials at the interface between glass and water layers in a total internal reflection fluorescence microscopy (TIRFM) technique can decrease the detection volume of a target sample, and hence improve the resolution of the obtained image. In particular, we calculate the change in fluorescence characteristics of the fluorophore labels on a target sample when monolayer black phosphorus, hexagonal boron nitride, and graphene are added at the glass-water interface of a TIRFM structure. We also calculate the change in the detection volume due to the presence of two-dimensional materials, and when the polarization, wavelength, and angle of the incident light vary. We find $\gtrsim $ 10% and $\gtrsim $ 5% decrease in the detection volume when monolayer black phosphorus and hexagonal boron nitride are used, respectively, and up to ~50% decrease when monolayer graphene is used. The proposed use of the two-dimensional material will significantly improve the resolution of TIRFM technique, and hence facilitate the study of nanoscale biological features.
Metadata
Item Type: | Article |
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Authors/Creators: |
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Copyright, Publisher and Additional Information: | © 2017 IOP Publishing Ltd. This is an author-created, un-copyedited version of an article published in Materials Research Express. IOP Publishing Ltd is not responsible for any errors or omissions in this version of the manuscript or any version derived from it. The Version of Record is available online at https://doi.org/10.1088/2053-1591/aa8a0f. Uploaded in accordance with the publisher's self-archiving policy. |
Keywords: | two-dimensional material, total internal reflection, fluorescence microscopy |
Dates: |
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Institution: | The University of Leeds |
Academic Units: | The University of Leeds > Faculty of Engineering & Physical Sciences (Leeds) > School of Electronic & Electrical Engineering (Leeds) > Pollard Institute (Leeds) |
Depositing User: | Symplectic Publications |
Date Deposited: | 17 Nov 2017 16:03 |
Last Modified: | 04 Sep 2018 00:38 |
Status: | Published |
Publisher: | IOP Publishing |
Identification Number: | 10.1088/2053-1591/aa8a0f |
Related URLs: | |
Open Archives Initiative ID (OAI ID): | oai:eprints.whiterose.ac.uk:123982 |