Measurement of the emission spectrum of a semiconductor laser using laser-feedback interferometry

Keeley, JT orcid.org/0000-0001-5251-6648, Freeman, JR orcid.org/0000-0002-5493-6352, Bertling, K orcid.org/0000-0003-1087-2315 et al. (9 more authors) (2017) Measurement of the emission spectrum of a semiconductor laser using laser-feedback interferometry. Scientific Reports, 7. 7236. ISSN 2045-2322

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Dates:
  • Accepted: 28 June 2017
  • Published (online): 3 August 2017
  • Published: 3 August 2017
Institution: The University of Leeds
Academic Units: The University of Leeds > Faculty of Engineering & Physical Sciences (Leeds) > School of Electronic & Electrical Engineering (Leeds) > Pollard Institute (Leeds)
Funding Information:
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Grant number
EU - European Union
CGA-BM1205-1
EPSRC
EP/J002356/1
Royal Society
WM110032
EPSRC
EP/J017671/1
Royal Society
WM150029
Depositing User: Symplectic Publications
Date Deposited: 04 Aug 2017 11:13
Last Modified: 13 Dec 2024 15:33
Status: Published
Publisher: Nature Publishing Group
Identification Number: 10.1038/s41598-017-07432-0
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