Hayes, D.G., Allford, C.P., Smith, G.V. et al. (7 more authors) (2017) Electron transport lifetimes in InSb/Al1-xInxSb quantum well 2DEGs. Semiconductor Science and Technology, 32 (8). 085002. ISSN 0268-1242
Abstract
We report magnetotransport measurements of InSb/Al1-xInxSb modulation doped quantum well (QW) structures and the extracted transport ( ) tt and quantum (tq) lifetime of carriers at low temperature (<2K.) We consider conventional transport lifetimes over a range of samples with different doping levels and carrier densities, and deduce different transport regimes dependent on QW state filling calculated from self-consistent Schrödinger–Poisson modelling. For samples where only the lowest QW subband is occupied at electron densities of 2.13 10 ´ 11 cm−2 and 2.54 10 ´ 11 cm−2 quantum lifetimes of tq » 0.107 ps, and tq » 0.103 ps are extracted from Shubnikov–de Haas oscillations below a magnetic field of 0.8 T. The extracted ratios of transport to quantum lifetimes, t t t q » 17 and t t t q » 20 are similar to values reported in other binary QW two-dimensional electron gas systems, but are inconsistent with predictions from transport modelling which assumes that remote ionized donors are the dominant scattering mechanism. We find the low t t t q ratio and the variation in transport mobility with carrier density cannot be explained by reasonable levels of background impurities or well width fluctuations. Thus, there is at least one additional scattering mechanism unaccounted for, most likely arising from structural defects.
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Item Type: | Article |
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Authors/Creators: |
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Copyright, Publisher and Additional Information: | Original content from this work may be used under the terms of the Creative Commons Attribution 3.0 licence. Any further distribution of this work must maintain attribution to the author(s) and the title of the work, journal citation and DOI. |
Keywords: | indium antimonide; quantum well 2DEG; magnetotransport; quantum lifetime; transport mobility |
Dates: |
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Institution: | The University of Sheffield |
Academic Units: | The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Electronic and Electrical Engineering (Sheffield) |
Depositing User: | Symplectic Sheffield |
Date Deposited: | 25 Jul 2017 14:13 |
Last Modified: | 25 Jul 2017 14:13 |
Published Version: | https://doi.org/10.1088/1361-6641/aa75c8 |
Status: | Published |
Publisher: | IOP Publishing |
Refereed: | Yes |
Identification Number: | 10.1088/1361-6641/aa75c8 |
Related URLs: | |
Open Archives Initiative ID (OAI ID): | oai:eprints.whiterose.ac.uk:119485 |
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