Naftaly, M, Clarke, RG, Humphreys, DA et al. (1 more author) (2017) Metrology State-of-the-Art and Challenges in Broadband Phase-Sensitive Terahertz Measurements. Proceedings of the IEEE, PP (99). pp. 1-15. ISSN 0018-9219
Abstract
The two main modalities for making broadband phase-sensitive measurements at terahertz (THz) frequencies are vector network analyzers (VNA) and time-domain spectrometers (TDS). These measuring instruments have separate and fundamentally different operating principles and methodologies, and they serve very different application spaces. The different architectures give rise to different measurement challenges and metrological solutions. This article reviews these two measurement techniques and discusses the different issues involved in making measurements using these systems. Calibration, verification, and measurement traceability issues are reviewed, along with other major challenges facing these instrument architectures in the years to come. The differences in, and similarities between, the two measurement methods are discussed and analyzed. Finally, the operating principles of electro-optic sampling (EOS) are briefly discussed. This technique has some similarities to TDS and shares application space with the VNA.
Metadata
Item Type: | Article |
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Authors/Creators: |
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Copyright, Publisher and Additional Information: | © 2017 IEEE. This is an author produced version of a paper published in Proceedings of the IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. Uploaded in accordance with the publisher's self-archiving policy. |
Keywords: | vector network analyzers, Electro-optic sampling, metrology, submillimeter waves, terahertz, time-domain spectrometers |
Dates: |
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Institution: | The University of Leeds |
Academic Units: | The University of Leeds > Faculty of Engineering & Physical Sciences (Leeds) > School of Electronic & Electrical Engineering (Leeds) |
Depositing User: | Symplectic Publications |
Date Deposited: | 21 Mar 2017 11:02 |
Last Modified: | 19 Jan 2018 12:14 |
Published Version: | https://doi.org/10.1109/JPROC.2016.2644108 |
Status: | Published |
Publisher: | IEEE |
Identification Number: | 10.1109/JPROC.2016.2644108 |
Open Archives Initiative ID (OAI ID): | oai:eprints.whiterose.ac.uk:113948 |