Khalid, A, Cumming, D, Clarke, R et al. (2 more authors) (2016) Evaluation of a VNA-based Material Characterization Kit at Frequencies from 0.75 THz to 1.1 THz. In: Yu, J and Chen, X, (eds.) Proceedings of the 2016 IEEE 9th UK-Europe-China Workshop on Millimeter Waves and THz Technologies. IEEE UCMMT 2016, 05-07 Sep 2016, Qingdao, China. IEEE , pp. 38-41. ISBN 978-1-5090-2276-2
Abstract
This paper describes an initial assessment of a commercially available THz material characterization kit (MCK). The assessment is based on the measurement of several material samples. The MCK comprises two conical waveguide horn transitions and two sections of low-loss corrugated waveguide. A gap between the two corrugated waveguides allows the material samples to be inserted into the system during measurement. The MCK is attached to a THz Vector Network Analyzer (VNA), which measures S-parameters, in the frequency domain, of a material under test (MUT). A computer-based algorithm employing an iterative calculation derives values for material parameters (e.g. permittivity) from the measured S-parameters of the MUT. A MCK has been evaluated over the frequency range 0.75 THz to 1.1 THz, to assess the plausibility of results that can be obtained using such a technique. Two VNAs utilizing frequency extender heads were used for the investigation, with measurements being made with reference to a range of different calibration techniques and different calibration standards. Whilst some of the results obtained look reasonable, a significant proportion of the results were either difficult to interpret or showed inexplicable (i.e. non-physical) behavior. This indicates that much work is still needed before this technique can be used routinely for the measurement of material parameters at these very high frequencies.
Metadata
Item Type: | Proceedings Paper |
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Authors/Creators: |
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Copyright, Publisher and Additional Information: | © 2016 IEEE. This is an author produced version of a paper published in Proceedings of the 2016 IEEE 9th UK-Europe-China Workshop on Millimeter Waves and THz Technologies. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. Uploaded in accordance with the publisher's self-archiving policy. |
Keywords: | Calibration, Permittivity measurement, Frequency measurement, Standards, Extraterrestrial measurements, Permittivity, Waveguide transitions |
Dates: |
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Institution: | The University of Leeds |
Academic Units: | The University of Leeds > Faculty of Engineering & Physical Sciences (Leeds) > School of Electronic & Electrical Engineering (Leeds) |
Depositing User: | Symplectic Publications |
Date Deposited: | 21 Mar 2017 10:43 |
Last Modified: | 21 Mar 2017 10:43 |
Published Version: | https://doi.org/10.1109/UCMMT.2016.7873952 |
Status: | Published |
Publisher: | IEEE |
Identification Number: | 10.1109/UCMMT.2016.7873952 |
Open Archives Initiative ID (OAI ID): | oai:eprints.whiterose.ac.uk:113945 |