Lioliou, G., Meng, X., Ng, J.S. orcid.org/0000-0002-1064-0410 et al. (1 more author) (2016) Temperature dependent characterization of gallium arsenide X-ray mesa p-i-n photodiodes. Journal of Applied Physics, 119 (12). 124507-1-124507-9. ISSN 0021-8979
Abstract
Electrical characterization of two GaAs p+-i-n+ mesa X-ray photodiodes over the temperature range 0 °C to 120 °C together with characterization of one of the diodes as an X-ray detector over the temperature range 0 °C to 60 °C is reported as part of the development of photon counting X-ray spectroscopic systems for harsh environments. The randomly selected diodes were fully etched and unpassivated. The diodes were 200 μm in diameter and had 7 μm thick i layers. The leakage current density was found to increase from (3 ± 1) nA/cm−2 at 0 °C to (24.36 ± 0.05) μA/cm−2 at 120 °C for D1 and from a current density smaller than the uncertainty (0.2 ± 1.2) nA/cm−2 at 0 °C to (9.39 ± 0.02) μA/cm−2 at 120 °C for D2 at the maximum investigated reverse bias (15 V). The best energy resolution (FWHM at 5.9 keV) was achieved at 5 V reverse bias, at each temperature; 730 eV at 0 °C, 750 eV at 20 °C, 770 eV at 40 °C, and 840 eV at 60 °C. It was found that the parallel white noise was the main source of the photopeak broadening only when the detector operated at 60 °C, at 5 V, 10 V, and 15 V reverse bias and at long shaping times (>5 μs), whereas the sum of the dielectric noise and charge trapping noise was the dominant source of noise for all the other spectra.
Metadata
Item Type: | Article |
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Authors/Creators: |
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Copyright, Publisher and Additional Information: | © 2016 AIP Publishing. This is an author produced version of a paper subsequently published in Journal of Applied Physics. Uploaded in accordance with the publisher's self-archiving policy. |
Dates: |
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Institution: | The University of Sheffield |
Academic Units: | The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Electronic and Electrical Engineering (Sheffield) |
Depositing User: | Symplectic Sheffield |
Date Deposited: | 16 Feb 2017 10:03 |
Last Modified: | 11 Apr 2017 00:59 |
Published Version: | https://doi.org/10.1063/1.4944892 |
Status: | Published |
Publisher: | AIP Publishing |
Refereed: | Yes |
Identification Number: | 10.1063/1.4944892 |
Open Archives Initiative ID (OAI ID): | oai:eprints.whiterose.ac.uk:111892 |