Simulations and Measurements in Scanning Electron Microscopes at Low Electron Energy.

Walker, Christopher George Havelock, Mullerova, Ilona and Frank, Ludek (2016) Simulations and Measurements in Scanning Electron Microscopes at Low Electron Energy. Scanning. 802–818. ISSN 0161-0457

Metadata

Item Type: Article
Authors/Creators:
  • Walker, Christopher George Havelock (christopher.walker@york.ac.uk)
  • Mullerova, Ilona
  • Frank, Ludek
Copyright, Publisher and Additional Information:

© 2016, John Wiley & Sons, Inc. This is an author-produced version of the published paper. Uploaded in accordance with the publisher’s self-archiving policy. Further copying may not be permitted; contact the publisher for details.
Dates:
  • Published (online): 10 June 2016
  • Accepted: 16 May 2016
Institution: The University of York
Academic Units: The University of York > Faculty of Sciences (York) > Electronic Engineering (York)
Depositing User: Pure (York)
Date Deposited: 17 Oct 2016 10:42
Last Modified: 16 Oct 2024 13:07
Published Version: https://doi.org/10.1002/sca.21330
Status: Published online
Refereed: Yes
Identification Number: 10.1002/sca.21330
Open Archives Initiative ID (OAI ID):

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