Taras, P., Li, G.J. orcid.org/0000-0002-5956-4033 and Zhu, Z.Q. (2017) Comparative Study of Fault Tolerant Switched Flux Permanent Magnet Machines. IEEE Transactions on Industrial Electronics, 64 (3). pp. 1939-1948. ISSN 0278-0046
Abstract
The fault tolerant capabilities are compared in this paper for the conventional double layer switched flux permanent magnet machine and its single layer counterparts, i.e. C-core, Ecore and modular. The comparison includes the inter-turn shortcircuit and irreversible demagnetization faults. A combination of Simulink and finite element models is used in the study. Based on the predictions, it is found that the modular topology produces the lowest short-circuit current and also has the best demagnetization withstand capability while the conventional one produces the highest short-circuit current and has the worst demagnetization withstand capability. The frozen permeability method is employed to separate the flux produced by armature current and magnets, and the results showed that, besides the influence of short-circuit current, the available magnet volume and magnetic circuit configuration play an important role in the demagnetization process. It is also found that removing half of the magnets, such as using C-core, E-core and modular topologies, generally improves the demagnetization withstand capability and also increases the torque per magnet volume. Measured results are also presented to validate the short-circuit current predictions and magnet demagnetization.
Metadata
Item Type: | Article |
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Authors/Creators: |
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Copyright, Publisher and Additional Information: | © IEEE 2016. This is an author produced version of a paper subsequently published in IEEE Transactions on Industrial Electronics. Uploaded in accordance with the publisher's self-archiving policy. |
Keywords: | Demagnetization; fault tolerance; fault tolerant control; permanent magnets; permanent magnet motors; reliability; short-circuit currents; temperature dependence |
Dates: |
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Institution: | The University of Sheffield |
Academic Units: | The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Electronic and Electrical Engineering (Sheffield) |
Depositing User: | Symplectic Sheffield |
Date Deposited: | 19 Oct 2016 13:28 |
Last Modified: | 18 Jul 2017 04:21 |
Published Version: | https://doi.org/10.1109/TIE.2016.2627022 |
Status: | Published |
Publisher: | Institute of Electrical and Electronics Engineers (IEEE) |
Refereed: | Yes |
Identification Number: | 10.1109/TIE.2016.2627022 |
Open Archives Initiative ID (OAI ID): | oai:eprints.whiterose.ac.uk:106072 |