Li, K., Li, Y., Yu, K.Y. et al. (5 more authors) (2016) Crystal size induced reduction in thermal hysteresis of Ni-Ti-Nb shape memory thin films. Applied Physics Letters, 108 (17). p. 171907. ISSN 0003-6951
Abstract
Ni41.7Ti38.8Nb19.5 shape memory alloy films were sputter-deposited onto silicon substrates and annealed at various temperatures. A narrow thermal hysteresis was obtained in the Ni-Ti-Nb films with a grain size of less than 50 nm. The small grain size, or large amount of grain boundaries, facilitates the phase transformation, thus reduces the hysteresis. The corresponding less transformation friction and heat transfer during the shear process, as well as reduced spontaneous lattice distortion, are also responsible for this reduction of the thermal hysteresis.
Metadata
Item Type: | Article |
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Authors/Creators: |
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Copyright, Publisher and Additional Information: | © 2016 AIP Publishing. This is an author produced version of a paper subsequently published in Applied Physics Letters. Uploaded in accordance with the publisher's self-archiving policy. |
Dates: |
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Institution: | The University of Sheffield |
Academic Units: | The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Materials Science and Engineering (Sheffield) |
Funding Information: | Funder Grant number EUROPEAN RESEARCH COUNCIL IMPUNEP - 320879 |
Depositing User: | Symplectic Sheffield |
Date Deposited: | 12 Oct 2016 11:53 |
Last Modified: | 25 Mar 2018 15:26 |
Published Version: | http://dx.doi.org/10.1063/1.4948377 |
Status: | Published |
Publisher: | AIP Publishing |
Refereed: | Yes |
Identification Number: | 10.1063/1.4948377 |
Open Archives Initiative ID (OAI ID): | oai:eprints.whiterose.ac.uk:105913 |