Angle selective backscattered electron contrast in the low-voltage scanning electron microscope: simulation & experiment for polymers

Wan, Q., Master, R.C., Lidsey, D. et al. (6 more authors) (2016) Angle selective backscattered electron contrast in the low-voltage scanning electron microscope: simulation & experiment for polymers. Ultramicroscopy, 171. pp. 126-138. ISSN 0304-3991

Abstract

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Item Type: Article
Authors/Creators:
Copyright, Publisher and Additional Information:

© 2016 The Authors. Published by Elsevier B.V. This is an open access article under the CC BY license (http://creativecommons.org/licenses/by/4.0/)

Keywords: Low-voltage scanning electron microscopy; Quantitative back-scattered imaging; Polymer; Concentric back scattered detector; Angle selective SEM
Dates:
  • Published: December 2016
  • Published (online): 15 September 2016
  • Accepted: 11 September 2016
Institution: The University of Sheffield
Academic Units: The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Materials Science and Engineering (Sheffield)
Funding Information:
Funder
Grant number
LEVERHULME TRUST (THE)
VP1-2014-011
ENGINEERING AND PHYSICAL SCIENCE RESEARCH COUNCIL (EPSRC)
EP/N008065/1
Depositing User: Symplectic Sheffield
Date Deposited: 15 Sep 2016 13:45
Last Modified: 31 Jul 2017 11:27
Published Version: http://dx.doi.org/10.1016/j.ultramic.2016.09.006
Status: Published
Publisher: Elsevier
Refereed: Yes
Identification Number: 10.1016/j.ultramic.2016.09.006
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