Avalanche Noise in Al0.52In0.48P Diodes

Qiao, L., Cheong, J.S., Ong, J.S.L. et al. (4 more authors) (2015) Avalanche Noise in Al0.52In0.48P Diodes. IEEE Photonics Technology Letters, 28 (4). pp. 481-484. ISSN 1041-1135



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Keywords: Avalanche photodiodes; avalanche multiplication; excess noise; impact ionization; AlInP; narrow band detector
  • Published: 10 November 2015
Institution: The University of Sheffield
Academic Units: The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Electronic and Electrical Engineering (Sheffield)
Depositing User: Symplectic Sheffield
Date Deposited: 05 May 2016 11:31
Last Modified: 28 Mar 2018 19:31
Published Version: http://dx.doi.org/10.1109/LPT.2015.2499545
Status: Published
Publisher: Institute of Electrical and Electronics Engineers
Refereed: Yes
Identification Number: https://doi.org/10.1109/LPT.2015.2499545
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