Transmission electron microscopy of a model crystalline organic, theophylline

Abstract

We report on the use of transmission electron microscopy (TEM) to analyse the diffraction patterns of the model crystalline organic theophylline to investigate beam damage in relation to changing accelerating voltage, sample temperature and TEM grid support films. We find that samples deposited on graphene film grids have the longest lifetimes when also held at -190 °C and imaged at 200 kV accelerating voltage. Finally, atomic lattice images are obtained in bright field STEM by working close to the estimated critical electron dose for theophylline.

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Authors/Creators:	Cattle, J S'ari, M Hondow, N Abellan, P Brown, AP Brydson, RMD
Copyright, Publisher and Additional Information:	© 2015, The Authors. Content from this work may be used under the terms of the Creative Commons Attribution 3.0 licence. Any further distribution of this work must maintain attribution to the author(s) and the title of the work, journal citation and DOI.
Dates:	Accepted: 11 August 2015 Published: 21 October 2015
Institution:	The University of Leeds
Academic Units:	The University of Leeds > Faculty of Engineering & Physical Sciences (Leeds) > School of Chemical & Process Engineering (Leeds) > Institute for Materials Research (Leeds)
Depositing User:	Symplectic Publications
Date Deposited:	18 Jan 2016 09:30
Last Modified:	18 Jan 2016 09:30
Published Version:	http://dx.doi.org/10.1088/1742-6596/644/1/012030
Status:	Published
Publisher:	IOP Publishing
Identification Number:	https://doi.org/10.1088/1742-6596/644/1/012030
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Transmission electron microscopy of a model crystalline organic, theophylline

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