Exploring backscattered imaging in low voltage FE-SEM

Lewis, P, Micklethwaite, S, Harrington, J et al. (3 more authors) (2015) Exploring backscattered imaging in low voltage FE-SEM. In: Journal of Physics: Conference Series. ELECTRON MICROSCOPY AND ANALYSIS GROUP CONFERENCE (EMAG2015), 30 Jun - 02 Jul 2015, Manchester, UK. IOP Publishing .



  • Lewis, P
  • Micklethwaite, S
  • Harrington, J
  • Dixon, M
  • Brydson, R
  • Hondow, N
Copyright, Publisher and Additional Information: © 2015, The Authors. Content from this work may be used under the terms of the Creative Commons Attribution 3.0 licence. Any further distribution of this work must maintain attribution to the author(s) and the title of the work, journal citation and DOI. Published under licence by IOP Publishing Ltd.
  • Accepted: 11 August 2015
  • Published: 21 October 2015
Institution: The University of Leeds
Academic Units: The University of Leeds > Faculty of Engineering & Physical Sciences (Leeds) > School of Chemical & Process Engineering (Leeds) > Institute for Materials Research (Leeds)
Depositing User: Symplectic Publications
Date Deposited: 14 Jan 2016 16:03
Last Modified: 18 Jan 2016 09:33
Published Version: http://dx.doi.org/10.1088/1742-6596/644/1/012019
Status: Published
Publisher: IOP Publishing
Identification Number: https://doi.org/10.1088/1742-6596/644/1/012019
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