Experimental study on dielectric relaxation of SiO2 nano-particle suspensions for developing a particle characterization method based on electrical impedance spectroscopy

Zhao, Y and Wang, M (2015) Experimental study on dielectric relaxation of SiO2 nano-particle suspensions for developing a particle characterization method based on electrical impedance spectroscopy. Powder Technology, 281. 200 - 213. ISSN 0032-5910

Abstract

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Authors/Creators:
  • Zhao, Y
  • Wang, M
Copyright, Publisher and Additional Information: © 2015 Elsevier B.V. All rights reserved. This is an author produced version of a paper published in Powder Technology. Uploaded in accordance with the publisher's self-archiving policy.
Keywords: Electrical impedance spectroscopy; Dielectric relaxation; Electrical double layer; Relaxation frequency; Tomographic image
Dates:
  • Accepted: 27 April 2015
  • Published: 1 September 2015
Institution: The University of Leeds
Academic Units: The University of Leeds > Faculty of Engineering & Physical Sciences (Leeds) > School of Chemical & Process Engineering (Leeds) > Institute for Particle Science and Engineering (Leeds)
Depositing User: Symplectic Publications
Date Deposited: 05 Oct 2015 10:44
Last Modified: 06 May 2016 01:35
Published Version: http://dx.doi.org/10.1016/j.powtec.2015.04.070
Status: Published
Publisher: Elsevier
Identification Number: https://doi.org/10.1016/j.powtec.2015.04.070
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