Evaluating the Effect of Using Precision Alignment Dowels on Connection Repeatability of Waveguide Devices at Frequencies from 750 GHz to 1.1 THz

Ridler, NM and Clarke, RG (2014) Evaluating the Effect of Using Precision Alignment Dowels on Connection Repeatability of Waveguide Devices at Frequencies from 750 GHz to 1.1 THz. In: Microwave Measurement Conference (ARFTG), 2014 84th ARFTG. 84th ARFTG Microwave Measurement Conference, 04-05 Dec 2014, Boulder, Colorado. IEEE , 1 - 10. ISBN 978-1-4799-7084-1

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Authors/Creators:
  • Ridler, NM
  • Clarke, RG
Copyright, Publisher and Additional Information: © 2014, IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other users, including reprinting/ republishing this material for advertising or promotional purposes, creating new collective works for resale or redistribution to servers or lists, or reuse of any copyrighted components of this work in other works.
Keywords: Measurement repeatability; submillimeter-wave measurements; VNA measurements; waveguide flanges; waveguide interfaces; waveguide measurements
Dates:
  • Published: 4 December 2014
Institution: The University of Leeds
Academic Units: The University of Leeds > Faculty of Engineering & Physical Sciences (Leeds) > School of Electronic & Electrical Engineering (Leeds)
Depositing User: Symplectic Publications
Date Deposited: 02 Oct 2015 09:24
Last Modified: 19 Jan 2018 13:13
Published Version: http://dx.doi.org/10.1109/ARFTG.2014.7013405
Status: Published
Publisher: IEEE
Identification Number: https://doi.org/10.1109/ARFTG.2014.7013405

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