Anisotropy constant of antiferromagnetic Pt50Mn50

We have measured the anisotropy constant of polycrystalline PtMn thin films deposited on different seed layer materials: Pt, Ru and Nb. Values as high as 2.5x10^7 erg/cc were achieved for samples deposited on Pt. The films can be crystallised into the antiferromagnetic, face-centred-tetragonal phase on Ru and Pt seed layers at annealing temperatures compatible with back-end-of-line conditions of up to 400C for one to three hours. Additionally these antiferromagnetic layers, 8 nm thick, are highly thermally stable with median blocking temperatures above 200C. The effect of diffusion on the stoichiometry of the PtMn layers is discussed with regards to the different seed layer materials.