Summary of the fourth international workshop on deep learning for testing and testing for deep learning (DeepTest 2023)

Biagiola, M., Cardozo, N., Shin, D. orcid.org/0000-0002-0840-6449 et al. (3 more authors) (2023) Summary of the fourth international workshop on deep learning for testing and testing for deep learning (DeepTest 2023). ACM SIGSOFT Software Engineering Notes, 48 (4). pp. 39-40. ISSN 0163-5948

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Copyright, Publisher and Additional Information: © 2023 Copyright is held by the owner/author(s). This is an author-produced version of a paper subsequently published in ACM SIGSOFT Software Engineering Notes. Uploaded in accordance with the publisher's self-archiving policy.
Dates:
  • Published (online): 17 October 2023
  • Published: October 2023
Institution: The University of Sheffield
Academic Units: The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Computer Science (Sheffield)
Depositing User: Symplectic Sheffield
Date Deposited: 10 Nov 2023 11:27
Last Modified: 10 Nov 2023 11:27
Status: Published
Publisher: Association for Computing Machinery (ACM)
Refereed: Yes
Identification Number: https://doi.org/10.1145/3617946.3617953

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