Enhanced two consecutive samples based de-modulation technique for atomic force microscopy application

This article investigates robust amplitude detectors suitable for atomic force microscopy (AFM) while discussing better alternatives. An AFM instrument’s measurement unit is responsible for providing the amplitude information obtained from the tip of a cantilever beam to identify the surface smoothness of a test material. Therefore, two efficient approaches are suggested to leverage Lyapunov’s theory while adhering to better noise suppression and DC-offset rejection capabilities. Nevertheless, an enhanced two samples-based Lyapunov’s demodulation approach is proposed to detect the amplitude information rapidly. Consequently, the modifications applied to the conventional method help reduce the tuning efforts and structural complications. The proposed solution remains structurally simpler and useful for high- and low-frequency probes. Furthermore, the extensive design guidelines for all techniques and the simulation results are presented. Different amplitude signals are synthetically generated from several rough pseudo-test surfaces for early verification and sent to a real-time digital controller to judge the proposal’s efficacy.