Modelling of transmission and reflection of thin layers for EMC applications in TLM

Abstract

The paper describes a method for designing recursive filters for frequency dependent boundary conditions in the TLM method using frequency domain data. The approach described here allows the development of boundary conditions representing thin inhomogeneous composite materials where an analytical approach is excessively complex. It has applications in EMC for the modelling of ferrite tile absorber materials, composite equipment enclosures, and mesh screens such as those used to shield apertures.

Metadata

Authors/Creators:	Dawson, J F https://orcid.org/0000-0003-4537-9977 Cole, J A Porter, S J (sjp1@york.ac.uk)
Dates:	Published: 1997
Institution:	The University of York
Academic Units:	The University of York > Faculty of Sciences (York) > Electronic Engineering (York)
Depositing User:	Pure (York)
Date Deposited:	25 Feb 2022 16:40
Last Modified:	06 Dec 2023 09:57
Published Version:	https://doi.org/10.1049/cp:19971120
Status:	Published
Publisher:	IEEE
Refereed:	Yes
Identification Number:	https://doi.org/10.1049/cp:19971120
Related URLs:	https://www.scopus.com/record/display.ur...

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Modelling of transmission and reflection of thin layers for EMC applications in TLM

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